B. Mohadjeri: search on Z-Library

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1

SIMS and depth profiling of semiconductor structures

B.G. Svensson, M.K. Linnarsson, B. Mohadjeri, M. Petravić, J.S. Williams

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

1994

Language:

english

File:

PDF, 801 KB

english, 1994

2

A low-complexity 62-GHz fT SiGe heterojunction bipolar transistor process using differential epitaxy and in situ phosphorus-doped poly-Si emitter at very low thermal budget

J.V Grahn, H Fosshaug, M Jargelius, P Jönsson, M Linder, B.G Malm, B Mohadjeri, J Pejnefors, H.H Radamson, M Sandén, Y.-B Wang, G Landgren, M Östling

Journal:

Solid-State Electronics

Year:

2000

Language:

english

File:

PDF, 404 KB

english, 2000

3

Isotope effects for ion-implantation profiles in silicon

B.G. Svensson, B. Mohadjeri

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

1991

Language:

english

File:

PDF, 502 KB

english, 1991

4

Shallow depth profiles of arsenic and boron in CoSi2 measured by secondary ion mass spectrometry

B. Mohadjeri, B.G. Svensson

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

1992

Language:

english

File:

PDF, 428 KB

english, 1992

5

Gettering of nickel to cavities in silicon introduced by hydrogen implantation

Mohadjeri, B., Williams, J. S., Wong-Leung, J.

Journal:

Applied Physics Letters

Year:

1995

Language:

english

File:

PDF, 355 KB

english, 1995

6

Investigations of evaporated silicon p-n junctions and their application to junction field-effect transistors

Tirén, J., Grelsson, Ö., Söderbärg, A., Magnusson, U., Norde, H., Svensson, B. G., Mohadjeri, B., Berg, S.

Journal:

Journal of Applied Physics

Year:

1990

Language:

english

File:

PDF, 655 KB

english, 1990

7

Nickel-enhanced solid-phase epitaxial regrowth of amorphous silicon

Mohadjeri, B., Linnros, J., Svensson, B. G., Östling, M.

Journal:

Physical Review Letters

Year:

1992

Language:

english

File:

PDF, 903 KB

english, 1992

8

Oxidation-enhanced roughening of thin Co films during sputtering by O+2 ions

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

1996

Language:

english

File:

PDF, 637 KB

english, 1996

9

Secondary ion mass spectrometry measurements of shallow boron profiles in cobalt, silicon, and cobalt disilicide

Journal:

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures

Year:

1994

Language:

english

File:

PDF, 599 KB

english, 1994

10

Oxidation and roughening of silicon during annealing in a rapid thermal processing chamber

Mohadjeri, B., Baklanov, M. R., Kondoh, E., Maex, K.

Journal:

Journal of Applied Physics

Year:

1998

Language:

english

File:

PDF, 505 KB

english, 1998

11

Surface recession and oxidation of silicon during bombardment by low energy oxygen ions

Svensson, B. G., Mohadjeri, B., Petravić, M.

Journal:

Journal of Applied Physics

Year:

1994

Language:

english

File:

PDF, 767 KB

english, 1994

12

Divacancy acceptor levels in ion-irradiated silicon

Svensson, B. G., Mohadjeri, B., Hallén, A., Svensson, J. H., Corbett, J. W.

Journal:

Physical Review B

Year:

1991

Language:

english

File:

PDF, 417 KB

english, 1991

13

Formation of Nickel Silicides on Ion-Amorphized Silicon

Mohadjeri, B., Linnros, J., Svensson, B. G., ÖStling, M., Johanssons, S., D'Heurle, F. M.

Journal:

MRS Proceedings

Year:

1992

Language:

english

File:

PDF, 3.29 MB

english, 1992

14

Ion-Induced Amorphization and Regrowth of C49 and C54 TiSi[sub 2]

Journal:

Journal of The Electrochemical Society

Year:

1999

Language:

english

File:

PDF, 610 KB

english, 1999

15

Influence of Interface Roughness on Electrical Properties of pMOSFETs with a Si/Si1- xGex Channel

Lindgren, A.-C., Hellberg, P.-E., Mohadjeri, B., Zhang, S.-L., ?stling, M.

Journal:

Physica Scripta

Year:

2002

Language:

english

File:

PDF, 183 KB

english, 2002

16

Growth of High Frequency SiGe Heterojunction Bipolar Transistors Structures

Radamson, H. H., Mohadjeri, B., Menon, C., Bentzen, A., Grahn, J., Landgren, G.

Journal:

Physica Scripta

Year:

2002

Language:

english

File:

PDF, 146 KB

english, 2002

17

Activation of Sb in Ultra-Shallow Poly-Silicon Emitters Using Rapid Thermal Processing.

Grelsson, Ö., Söderbärg, A., Magnusson, U., Olsson, J., Mohadjeri, B.

Journal:

MRS Proceedings

Year:

1991

Language:

english

File:

PDF, 271 KB

english, 1991

18

Phase Transformations in a-Si/Ni/C-Si Structures with Different Interfacial Ni Layer Thicknesses

Kuznetsov, A.Yu., Khodos, I. I., Linnros, J., Mohadjeri, B., Monakhov, E. V., Svensson, B. G.

Journal:

MRS Proceedings

Year:

1994

Language:

english

File:

PDF, 2.17 MB

english, 1994

19

Feasibility and acceptability of an oral pathology asynchronous tele-mentoring intervention: A protocol

Northridge, Mary E., Littlejohn, Tina, Mohadjeri-Franck, Nathalie, Gargano, Steven, Troxel, Andrea B., Wu, Yinxiang, Bowe, Robert B., Testa, Paul A.

Journal:

Journal of Public Health Research

Year:

2020

File:

PDF, 255 KB

2020

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